Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices

Author: Spinelli Alessandro S.   Monzio Compagnoni Christian   Lacaita Andrea L.  

Publisher: MDPI

E-ISSN: 2073-431x|6|2|16-16

ISSN: 2073-431x

Source: Computers, Vol.6, Iss.2, 2017-04, pp. : 16-16

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Abstract