Publisher: Trans Tech Publications
E-ISSN: 1662-9507|2018|386|48-54
ISSN: 1012-0386
Source: Defect and Diffusion Forum, Vol.2018, Iss.386, 2018-11, pp. : 48-54
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Identification of Vibrational Modes in BaSi2 Epitaxial Films by Infrared and Raman Spectroscopy
Defect and Diffusion Forum, Vol. 2018, Iss. 386, 2018-11 ,pp. :
Growth of Ru2Si3 Polycrystalline Thin Films by Solid Phase Epitaxy in Ru-Si Amorphous Layers
Defect and Diffusion Forum, Vol. 2018, Iss. 386, 2018-11 ,pp. :
Defect and Diffusion Forum, Vol. 2018, Iss. 386, 2018-11 ,pp. :
Conductivity Study of Initial Stages of β-PdBi2 Formation on Bi/Si(111)
Defect and Diffusion Forum, Vol. 2018, Iss. 386, 2018-11 ,pp. :