Improved power simulation of AlGaN/GaN HEMT at class-AB operation via an RF drain—source current correction method

Publisher: IOP Publishing

E-ISSN: 1741-4199|23|12|127304-127310

ISSN: 1674-1056

Source: Chinese Physics B, Vol.23, Iss.12, 2014-12, pp. : 127304-127310

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Abstract