Author： Coppeta R.A. Holec D. Ceric H. Grasser T.
Publisher： Taylor & Francis Ltd
E-ISSN： 1478-6443|95|2|186-209
ISSN： 1478-6443
Source： Philosophical Magazine, Vol.95, Iss.2, 2015-01, pp. : 186-209
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Access to resources
Recommend
Critical thickness for dislocation generation in epitaxial piezoelectric thin films
By Wang Biao
Philosophical Magazine, Vol. 83, Iss. 31-34, 2003-01 ,pp. :
Dislocation dynamics simulations of the relaxation of intrinsic stress in thin films
Philosophical Magazine, Vol. 88, Iss. 30-32, 2008-10 ,pp. :
The elastic potential energy of a thin foil deformed by an in-plane 60° dislocation
By Youssef S.
Philosophical Magazine, Vol. 87, Iss. 31, 2007-11 ,pp. :
Formation and evaluation of CeN thin films
Thin Solid Films, Vol. 317, Iss. 1, 1998-04 ,pp. :