On the features of dislocation-obstacle interaction in thin films: large-scale atomistic simulation

Author: Osetsky Y. N.   Matsukawa Y.   Stoller R. E.   Zinkle S. J.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3036

Source: Philosophical Magazine Letters, Vol.86, Iss.8, 2006-08, pp. : 511-519

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Abstract