Microspotting: Film Structure of Epitaxial Graphene Oxide on SiC: Insight on the Relationship Between Interlayer Spacing, Water Content, and Intralayer Structure (Adv. Mater. Interfaces 3/2014)

Publisher： John Wiley & Sons Inc

E-ISSN： 2196-7350|1|3|n/a-n/a

ISSN： 2196-7350

Source： ADVANCED MATERIALS INTERFACES (ELECTRONIC), Vol.1, Iss.3, 2014-06, pp. : n/a-n/a

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