Total‐reflection X‐ray fluorescence analysis and related methods, Second Edition Edited by ReinholdKlockenkaemper and AlexvonBohlenJohn Wiley
Publisher: John Wiley & Sons Inc
E-ISSN: 1097-4539|44|6|417-417
ISSN: 0049-8246
Source: X-RAY SPECTROMETRY, Vol.44, Iss.6, 2015-11, pp. : 417-417
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Abstract