Aberration‐Corrected Transmission Electron Microscopy and In Situ XAFS Structural Characterization of Pt/γ‐Al2O3 Nanoparticles

Publisher: John Wiley & Sons Inc

E-ISSN: 1867-3899|7|22|3779-3787

ISSN: 1867-3880

Source: CHEMCATCHEM (ELECTRONIC), Vol.7, Iss.22, 2015-11, pp. : 3779-3787

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