Transmission electron microscopy investigation of the effect of deposition conditions and a platinum layer in gas-sensitive r.f.-sputtered SnO 2 films

By Serventi A.M.   Rickerby D.G.   Horrillo M.C.   Saint-Jacques R.G.  

Thin Solid Films, Vol. 445, Iss. 1, 2003-11 ,pp. : 38-47

Elsevier

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Porous SiO 2 films analyzed by transmission electron microscopy

By Gignac L.M.   Parrill T.M.   Chandrashekhar G.V.  

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Characterization of SnO 2 thin films through thermoelectric power measurements

By Gordillo G.   Paez B.   Jacome C.   Florez J.M.  

Thin Solid Films, Vol. 342, Iss. 1, 1999-03 ,pp. : 160-166

Elsevier

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Characterization of SnO 2 thin films grown from aqueous solutions

By Supothina S.   De Guire M.R.  

Thin Solid Films, Vol. 371, Iss. 1, 2000-08 ,pp. : 1-9

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Characterization of the interfacial region of epitaxial TlBiSe 2 thin films by infrared spectroscopy and transmission electron microscopy

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Thin Solid Films, Vol. 353, Iss. 1, 1999-09 ,pp. : 85-92

Elsevier

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