Outage probability in Poisson‐cluster‐based LTE two‐tier femtocell networks

Publisher: John Wiley & Sons Inc

E-ISSN: 1530-8677|15|18|2179-2190

ISSN: 1530-8669

Source: WIRELESS COMMUNICATIONS & MOBILE COMPUTING (ELECTRONIC), Vol.15, Iss.18, 2015-12, pp. : 2179-2190

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract