Absolute interferometric characterization of an x-ray mirror surface profile

Author: Vannoni Maurizio   Vannoni Maurizio  

Publisher: IOP Publishing

E-ISSN: 1681-7575|53|1|1-6

ISSN: 0026-1394

Source: Metrologia, Vol.53, Iss.1, 2016-02, pp. : 1-6

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