Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy

Author: Dagdeviren Omur E   Götzen Jan   Hölscher Hendrik   Altman Eric I   Schwarz Udo D  

Publisher: IOP Publishing

E-ISSN: 1361-6528|27|6|65703-65712

ISSN: 0957-4484

Source: Nanotechnology, Vol.27, Iss.6, 2016-02, pp. : 65703-65712

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