Swift Heavy Ion Induced Defect Study in Epitaxial n-Type CaAs from ${\it In}$ ${\it Situ}$ Hall Effect Measurements

E-ISSN： 1286-4897|7|8|1661-1676

ISSN： 1155-4320

Source： Journal de Physique III, Vol.7, Iss.8, 1997-08, pp. : 1661-1676

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