Monte Carlo study of 50 nm-long single and dual-gate MODFETs: suppression of short-channel effects

E-ISSN： 1286-4897|3|9|1719-1728

ISSN： 1155-4320

Source： Journal de Physique III, Vol.3, Iss.9, 1993-09, pp. : 1719-1728

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