Fast Atomic-Scale Elemental Mapping of Crystalline Materials by STEM Energy-Dispersive X-Ray Spectroscopy Achieved with Thin Specimens

Publisher： Cambridge University Press

E-ISSN： 1435-8115|23|1|145-154

ISSN： 1431-9276

Source： Microscopy and Microanalysis, Vol.23, Iss.1, 2017-02, pp. : 145-154

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