Measurement Error in Atomic-Scale Scanning Transmission Electron Microscopy—Energy-Dispersive X-Ray Spectroscopy (STEM-EDS) Mapping of a Model Oxide Interface

Publisher： Cambridge University Press

E-ISSN： 1435-8115|23|3|513-517

ISSN： 1431-9276

Source： Microscopy and Microanalysis, Vol.23, Iss.3, 2017-04, pp. : 513-517

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