Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries

By  

Microscopy and Microanalysis, Vol. 23, Iss. 2, 2017-02 ,pp. : 291-299

Cambridge University Press

Access to resources Recommend Favorite

Understanding of Capping Effects on the Tip Shape Evolution and on the Atom Probe Data of Bulk LaAlO₃ Using Transmission Electron Microscopy

By  

Microscopy and Microanalysis, Vol. 23, Iss. 2, 2017-02 ,pp. : 329-335

Cambridge University Press

Access to resources Recommend Favorite

Detecting Clusters in Atom Probe Data with Gaussian Mixture Models

By  

Microscopy and Microanalysis, Vol. 23, Iss. 2, 2017-04 ,pp. : 269-278

Cambridge University Press

Access to resources Recommend Favorite

Comparing the Consistency of Atom Probe Tomography Measurements of Small-Scale Segregation and Clustering Between the LEAP 3000 and LEAP 5000 Instruments

By  

Microscopy and Microanalysis, Vol. 23, Iss. 2, 2017-04 ,pp. : 227-237

Cambridge University Press

Access to resources Recommend Favorite

Analysis of Radiation Damage in Light Water Reactors: Comparison of Cluster Analysis Methods for the Analysis of Atom Probe Data

By  

Microscopy and Microanalysis, Vol. 23, Iss. 2, 2017-01 ,pp. : 366-375

Cambridge University Press

Access to resources Recommend Favorite