Correlating Atom Probe Crystallographic Measurements with Transmission Kikuchi Diffraction Data

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Microscopy and Microanalysis, Vol. 23, Iss. 2, 2017-03 ,pp. : 279-290

Cambridge University Press

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Annular Bright-Field Scanning Transmission Electron Microscopy: Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials

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Microscopy Today, Vol. 25, Iss. 6, 2017-10 ,pp. : 36-41

Cambridge University Press

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Toward the Atomic-Level Mass Analysis of Biomolecules by the Scanning Atom Probe

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Microscopy and Microanalysis, Vol. 23, Iss. 2, 2016-12 ,pp. : 336-339

Cambridge University Press

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Understanding of Capping Effects on the Tip Shape Evolution and on the Atom Probe Data of Bulk LaAlO₃ Using Transmission Electron Microscopy

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Microscopy and Microanalysis, Vol. 23, Iss. 2, 2017-02 ,pp. : 329-335

Cambridge University Press

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Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping Layers

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Microscopy and Microanalysis, Vol. 23, Iss. 2, 2016-10 ,pp. : 321-328

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