Interfaces in Oxides Formed on NiAlCr Doped with Y, Hf, Ti, and B

Publisher: Cambridge University Press

E-ISSN: 1435-8115|23|2|396-403

ISSN: 1431-9276

Source: Microscopy and Microanalysis, Vol.23, Iss.2, 2017-03, pp. : 396-403

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content