Comparing the Consistency of Atom Probe Tomography Measurements of Small-Scale Segregation and Clustering Between the LEAP 3000 and LEAP 5000 Instruments

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Microscopy and Microanalysis, Vol. 23, Iss. 2, 2017-04 ,pp. : 227-237

Cambridge University Press

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Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries

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Microscopy and Microanalysis, Vol. 23, Iss. 2, 2017-02 ,pp. : 291-299

Cambridge University Press

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Reflections on the Projection of Ions in Atom Probe Tomography

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Microscopy and Microanalysis, Vol. 23, Iss. 2, 2017-02 ,pp. : 238-246

Cambridge University Press

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Nanoscale Stoichiometric Analysis of a High-Temperature Superconductor by Atom Probe Tomography

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Microscopy and Microanalysis, Vol. 23, Iss. 2, 2017-01 ,pp. : 414-424

Cambridge University Press

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Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping Layers

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Microscopy and Microanalysis, Vol. 23, Iss. 2, 2016-10 ,pp. : 321-328

Cambridge University Press

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