Processes and Effects of Oxygen and Moisture in Resistively Switching TaOx and HfOx

Publisher： John Wiley & Sons Inc

E-ISSN： 2199-160x|4|1|aelm.201700458-aelm.201700458

ISSN： 2199-160X

Source： ADVANCED ELECTRONIC MATERIALS, Vol.4, Iss.1, 2018-01, pp. : n/a-n/a

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