Publisher: John Wiley & Sons Inc
E-ISSN: 1099-1204|31|1|jnm.2260-jnm.2260
ISSN: 0894-3370
Source: INTERNATIONAL JOURNAL OF NUMERICAL MODELLING: ELECTRONIC NETWORKS, DEVICES AND FIELDS, Vol.31, Iss.1, 2018-01, pp. : n/a-n/a
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Abstract
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Transport effects in semi-metals and narrow-gap semiconductors
Advances In Physics, Vol. 14, Iss. 55, 1965-07 ,pp. :