Inverse transformation: unleashing spatially heterogeneous dynamics with an alternative approach to XPCS data analysis

Publisher: John Wiley & Sons Inc

E-ISSN: 1600-5767|51|1|35-46

ISSN: 0021-8898

Source: JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.51, Iss.1, 2018-02, pp. : 35-46

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Abstract