Determination of deviatoric elastic strain and lattice orientation by applying digital image correlation to Laue microdiffraction images: the enhanced Laue‐DIC method

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JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 6, 2015-12 ,pp. : 1805-1817

John Wiley & Sons Inc

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A look‐up table based approach to characterize crystal twinning for synchrotron X‐ray Laue microdiffraction scans

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JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 3, 2015-06 ,pp. : 747-757

John Wiley & Sons Inc

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Laue pattern analysis for two‐dimensional strain mapping in light‐ion‐implanted polycrystals

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JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 4, 2015-08 ,pp. : 990-999

John Wiley & Sons Inc

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X‐ray micro Laue diffraction tomography analysis of a solid oxide fuel cell

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JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol. 48, Iss. 2, 2015-04 ,pp. : 357-364

John Wiley & Sons Inc

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New zircon shock phenomena and their use for dating and reconstruction of large impact structures revealed by electron nanobeam (EBSD, CL, EDS) and isotopic U–Pb and (U–Th)/He analysis of the Vredefort dome

By Cupelli C. L.   Barker I. R.   Flowers R. M.   Bowman J. R.   Wooden J.   Hart J.R.  

Canadian Journal of Earth Sciences, Vol. 48, Iss. 2, 2011-02 ,pp. : 117-139

NRC Research Press

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