Publisher: John Wiley & Sons Inc
E-ISSN: 1365-2818|205|1|96-105
ISSN: 0022-2720
Source: JOURNAL OF MICROSCOPY, Vol.205, Iss.1, 2002-01, pp. : 96-105
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Abstract
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On the role of electron–ion recombination in low vacuum scanning electron microscopy
JOURNAL OF MICROSCOPY, Vol. 205, Iss. 1, 2002-01 ,pp. :