Recovery Mechanism of Degraded Black Phosphorus Field‐Effect Transistors by 1,2‐Ethanedithiol Chemistry and Extended Device Stability

Publisher: John Wiley & Sons Inc

E-ISSN: 1613-6829|14|6|smll.201703194-smll.201703194

ISSN: 1613-6810

Source: SMALL, Vol.14, Iss.6, 2018-02, pp. : n/a-n/a

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Abstract