Publisher： John Wiley & Sons Inc
E-ISSN： 1539-6924|38|2|376-391
ISSN： 0272-4332
Source： RISK ANALYSIS, Vol.38, Iss.2, 2018-02, pp. : 376-391
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Bayesian Network Model with Application to Smart Power Semiconductor Lifetime Data
RISK ANALYSIS, Vol. 272-4332, Iss. 9, 2015-09 ,pp. :
Access to resources
Recommend
Bayesian Network Model with Application to Smart Power Semiconductor Lifetime Data
RISK ANALYSIS, Vol. 35, Iss. 9, 2015-09 ,pp. :
The Role of Risk Analysis in Understanding Ebola
RISK ANALYSIS, Vol. 35, Iss. 2, 2015-02 ,pp. :
Bayesian outbreak detection in the presence of reporting delays
BIOMETRICAL JOURNAL, Vol. 57, Iss. 6, 2015-11 ,pp. :