Bolometric properties of reactively sputtered TiO2−x films for thermal infrared image sensors

Publisher: IOP Publishing

E-ISSN: 1361-6463|48|35|355104-355112

ISSN: 0022-3727

Source: Journal of Physics D: Applied Physics, Vol.48, Iss.35, 2015-01, pp. : 355104-355112

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Abstract