Vacuum

Publisher: Elsevier

Founded in: 1951

Total resources: 93

E-ISSN: 1879-2715

ISSN: 0042-207X

Subject: TB7 vacuum technology

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Vacuum

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Interfacial electron density profile in Nb/Si bilayer films: an X-ray reflectivity study

By Suresh N., Thakur R., Phase D.M., Chaudhari S.M. in (2004)

Vacuum , Vol. 72, Iss. 4, 2004-01 , pp. 419-426

Elsevier

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Characteristics of DLC films by DC magnetron sputtering incorporated with cesium

By Choi D.J., Koo W.H., Jeong S.M., Han D.W., Lee D.Y., Baik H.K., Jang S.W., Lee S.M. in (2004)

Vacuum , Vol. 72, Iss. 4, 2004-01 , pp. 445-451

Elsevier

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Structural, optical and electrical properties of thermally evaporated Ag 2 S thin films

By El-Nahass M.M., Farag A.A.M., Ibrahim E.M., Abd-El-Rahman S. in (2004)

Vacuum , Vol. 72, Iss. 4, 2004-01 , pp. 453-460

Elsevier

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Preparation and electrical characterization of Cd 0.8 Zn 0.2 Te/Si thin films

By Prabakar K., Venkatachalam S., Jeyachandran Y.L., Narayandass S.K., Mangalaraj D. in (2004)

Vacuum , Vol. 72, Iss. 4, 2004-01 , pp. 475-479

Elsevier

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Vacuum performance of a beam screen with charcoal for the LHC long straight sections

By Anashin V.V., Dostovalov R.V., Krasnov A.A., Collins I.R., Malyshev O.B. in (2004)

Vacuum , Vol. 72, Iss. 4, 2004-01 , pp. 379-383

Elsevier

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Refraction properties of PECVD of silicon nitride film

By Kim B., Kim D.W., Han S.S. in (2004)

Vacuum , Vol. 72, Iss. 4, 2004-01 , pp. 385-392

Elsevier

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Microstructure and electrochemical properties of Zircaloy-4 under Fe ion irradiation

By Chen X.W., Bai X.D., Deng P.Y., Zhou Q.G., Yu R.H., Chen B.S. in (2004)

Vacuum , Vol. 72, Iss. 4, 2004-01 , pp. 467-473

Elsevier

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