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Author: Huang C.-Y. Chen W.-F. Chuan S.-Y. Chiu F.-C. Tseng J.-C. Lin I.-C. Chao C.-J. Leu L.-Y. Ker M.-D.
Publisher: Elsevier
ISSN: 0026-2714
Source: Microelectronics Reliability, Vol.44, Iss.2, 2004-02, pp. : 213-221
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