Imaging cobalt nanoparticles by amplitude modulation atomic force microscopy: comparison between low and high amplitude solutions

Author： Tello M. San Paulo A. Rodrguez T.R. Blanco M.C. Garca R.

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.97, Iss.1, 2003-10, pp. : 171-175

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