Interpretation of tapping mode atomic force microscopy data using amplitude-phase-distance measurements

Author: Chen X.   Davies M.C.   Roberts C.J.   Tendler S.J.B.   Williams P.M.   Davies J.   Dawkes A.C.   Edwards J.C.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.75, Iss.3, 1998-12, pp. : 171-181

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Abstract