Electrical characterization of metal-molecule-silicon junctions

Author： Wang W.   Lee T.   Kamdar M.   Reed M.A.   Stewart M.P.   Hwang J.-J.   Tour J.M.  

Publisher： Elsevier

ISSN： 0749-6036

Source： Superlattices and Microstructures, Vol.33, Iss.4, 2003-04, pp. : 217-226

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