Analysis of traps in high quality CVD diamond films through the temperature dependence of carrier dynamics

Author: Marinelli M.   Milani E.   Paoletti A.   Pucella G.   Tucciarone A.   Verona Rinati G.   Angelone M.   Pillon M.  

Publisher: Elsevier

ISSN: 0925-9635

Source: Diamond and Related Materials, Vol.12, Iss.10, 2003-10, pp. : 1733-1737

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