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John Wiley & Sons Inc

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Enhanced Responsivity of ZnSe‐Based Metal–Semiconductor–Metal Near‐Ultraviolet Photodetector via Impact Ionization (Phys. Status Solidi RRL 2/2018)

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PHYSICA STATUS SOLIDI - RAPID RESEARCH LETTERS (ELECTRONIC), Vol. 12, Iss. 2, 2018-02 ,pp. : n/a-n/a

John Wiley & Sons Inc

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Effect of the buffer layer on the metal–semiconductor–metal UV photodetector based on Al‐doped and undoped ZnO thin films with different device structures

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