The pulsed microwave damage trend of a bipolar transistor as a function of pulse parameters

Author： Zhen-Yang Ma   Chang-Chun Chai   Xing-Rong Ren   Yin-Tang Yang   Ying-Bo Zhao   Li-Ping Qiao  

Publisher： IOP Publishing

ISSN： 1674-1056

Source： Chinese Physics B, Vol.22, Iss.2, 2013-02, pp. : 28502-28506

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