TestLAN approach and protocols for the integration of distributed assembly and test networks

Author： Williams N.P.   Liu Y.   Nof S.Y.  

Publisher： Taylor & Francis Ltd

ISSN： 0020-7543

Source： International Journal of Production Research, Vol.40, Iss.17, 2002-11, pp. : 4505-4522

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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