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Taylor & Francis Ltd

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Characterization of linearly graded metamorphic InGaP buffer layers on GaAs using high-resolution X-ray diffraction

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Optical nonlinear properties of Cd 1-x Zn x Te epilayers grown on (100) GaAs by pulsed laser deposition

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Photocurrent measurements on GaAs 1-x N x epilayers grown by metalorganic chemical vapor deposition

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Characterization of ZnSe films grown on GaAs substrates with In x Ga l-x As and Al x Ga 1-x As buffer layers

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