A high-resolution transmission electron microscopy study of the {1011} twin-boundary structure in alpha -Ti

By Wang Y. C.   Ping D. H.   Li D. X.   Ye H. Q.  

Philosophical Magazine Letters, Vol. 74, Iss. 5, 1996-11 ,pp. : 367-373

Taylor & Francis Ltd

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Interaction of twin boundaries with stacking faults in 2H martensite: a high-resolution electron microscopy study

By Condó Adriana M.   Lovey Francisco C.   Torra Vicenç  

Philosophical Magazine, Vol. 83, Iss. 12, 2003-04 ,pp. : 1479-1493

Taylor & Francis Ltd

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High-resolution and conventional electron microscopy study of a Σ = 3, \[101]{121} twin grain boundary in molybdenum

By Vystavel T.   Peínisson J. M.   Gemperle A.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 81, Iss. 2, 2001-02 ,pp. : 417-429

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High-resolution transmission electron microscopy study of defects and interfaces in epitaxial TiO 2 films on sapphire and LaAlO 3

By Y.Huang J.   Park B. H.   Jan David   Pan X. Q.   Zhu Yuntian T.   Jia Q. X.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 82, Iss. 4, 2002-03 ,pp. : 735-749

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High-resolution transmission electron microscopy study of pulsed laser beam crystallized Si thin film: The formation of hexagonal Si and defects

By Kim J.H.   Lee J.Y.  

Thin Solid Films, Vol. 292, Iss. 1, 1997-01 ,pp. : 313-317

Elsevier

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