A new model for the (2x1) reconstructed CoSi2-Si(100) interface

Author: Buschmann V.   Fedina L.   Rodewald M.   Tendeloo G.V.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3036

Source: Philosophical Magazine Letters, Vol.77, Iss.3, 1998-03, pp. : 147-152

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Abstract