Atomic-scale mapping of local lattice distortions in highly strained coherent islands of InXGa1-XAs/GaAs by high-resolution electron microscopy and image processing

Author： Kret S.   Delamarre C.   Laval J.Y.   Dubon A.  

Publisher： Taylor & Francis Ltd

ISSN： 1362-3036

Source： Philosophical Magazine Letters, Vol.77, Iss.5, 1998-05, pp. : 249-256

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