Measurements of potential barrier height of grain boundaries in polycrystalline silicon by Kelvin probe force microscopy

Author： Tsurekawa S.   Kido K.   Watanabe T.  

Publisher： Taylor & Francis Ltd

ISSN： 1362-3036

Source： Philosophical Magazine Letters, Vol.85, Iss.1, 2005-01, pp. : 41-49

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