Potential profile evaluation of a diamond lateral p–n junction diode using Kelvin probe force microscopy

Publisher: John Wiley & Sons Inc

E-ISSN: 1862-6319|212|11|2589-2594

ISSN: 1862-6300

Source: PHYSICA STATUS SOLIDI (A) APPLICATIONS AND MATERIALS SCIENCE, Vol.212, Iss.11, 2015-11, pp. : 2589-2594

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Abstract