Strength of submicrometer diameter pillars of metallic glasses investigated with in situ transmission electron microscopy

Author: Chen C. Q.   Pei Y. T.   De Hosson J.Th.M.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3036

Source: Philosophical Magazine Letters, Vol.89, Iss.10, 2009-10, pp. : 633-640

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Abstract