Effect of substrate temperature in chloroaluminum phthalocyanine thin films deposition studied by scanning tunneling microscopy and tunneling spectroscopy

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Thin Solid Films, Vol. 315, Iss. 1, 1998-03 ,pp. : 1-4

Elsevier

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Scanning probe microscopy and tunnelling measurements of polycrystalline tin oxide films

By Wong T.K.S.   Man W.K.  

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Transmission electron microscopy studies on structure and defects in crystalline yttria and lanthanum oxide thin films grown on single crystal sapphire by molecular beam synthesis

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Taylor & Francis Ltd

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Topological inclusions in 2D smectic C films

By Pettey D.   Lubensky T. C.   Link D. R.  

Liquid Crystals, Vol. 25, Iss. 5, 1998-11 ,pp. : 579-587

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Surface characterization of oriented silver films on Si (100) substrates using scanning tunnelling microscopy

By Ali A.O.   Kshirsagar R.B.   Dharmadhikari C.V.  

Thin Solid Films, Vol. 323, Iss. 1, 1998-06 ,pp. : 105-109

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