![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Zu X. T. Sun K. Atzmon M. Wang L. M. You L. P. Wan F. R. Busby J. T. Was G. S. Adamson R. B.
Publisher: Taylor & Francis Ltd
ISSN: 1478-6443
Source: Philosophical Magazine, Vol.85, Iss.4-7, 2005-02, pp. : 649-659
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
10 MeV Proton Irradiation Effect on 4H-SiC nMOSFET Electrical Parameters
Materials Science Forum, Vol. 2014, Iss. 806, 2015-01 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
The Effect of Proton and Carbon Irradiation on 4H-SiC 1700V MPS Diode Characteristics
Materials Science Forum, Vol. 2015, Iss. 821, 2015-07 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Fretting wear characteristics of Zircaloy-4 tube
Wear, Vol. 219, Iss. 1, 1998-08 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Proton and Electron Irradiation in Oxynitrided Gate 4H-SiC MOSFET: A Recent Open Issue
Materials Science Forum, Vol. 2015, Iss. 821, 2015-07 ,pp. :