Transport studies of carbon-rich a-SiC x :H film through admittance and deep-level transient spectroscopy measurements

Author: Atilgan I.   Ozdemir O.   Akaoglu B.   Sel K.   Katircioglu B.  

Publisher: Taylor & Francis Ltd

ISSN: 1478-6443

Source: Philosophical Magazine, Vol.86, Iss.19, 2006-07, pp. : 2771-2796

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract