Depth profiling of thin ITO films by grazing incidence X-ray diffraction

By Vink T.J.   Neerinck D.G.  

Thin Solid Films, Vol. 278, Iss. 1, 1996-05 ,pp. : 12-17

Elsevier

Access to resources Recommend Favorite

Grazing incidence X-ray diffraction analysis of alkali fluoride thin films for optical devices

By Cremona M.   Mauricio M.H.P.   Fehlberg L.V.   Nunes R.A.   Scavarda do Carmo L.C.   de Avillez R.R.   Caride A.O.  

Thin Solid Films, Vol. 333, Iss. 1, 1998-11 ,pp. : 157-164

Elsevier

Access to resources Recommend Favorite

Investigation of ultra thin Ca/Cd-arachidate films by Grazing Incidence Diffraction (GID) with a conventional X-ray tube and a synchrotron radiation source

By Claudius J.   Gerber T.   Weigelt J.   Kinzler M.  

Thin Solid Films, Vol. 287, Iss. 1, 1996-10 ,pp. : 225-231

Elsevier

Access to resources Recommend Favorite

Grazing incidence X-ray diffraction and atomic force microscopy analysis of BaBi 2 Ta 2 O 9 thin films

By Mastelaro V.R.   Foschini C.R.   Varela J.A.  

Thin Solid Films, Vol. 415, Iss. 1, 2002-08 ,pp. : 57-63

Elsevier

Access to resources Recommend Favorite

X-ray photoelectron spectroscopy and grazing incidence X-ray reflectivity study of silicon nitride thin films

By Li B.   Fujimoto T.   Fukumoto N.   Honda K.   Kojima I.  

Thin Solid Films, Vol. 334, Iss. 1, 1998-12 ,pp. : 140-144

Elsevier

Access to resources Recommend Favorite