Heat- and electron-beam-induced transport of gold particles into silicon oxide and silicon studied by in situ high-resolution transmission electron microscopy

By Biskupek Johannes   Kaiser Ute   Falk Fritz  

Journal of Electron Microscopy, Vol. 57, Iss. 3, 2008-06 ,pp. : 83-89

Oxford University Press

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Electron-Beam-Induced-Current Investigation of GaN/AlGaN/Si Heterostructures Using Scanning Transmission Electron Microscopy

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Journal of Electron Microscopy, Vol. 56, Iss. 4, 2007-08 ,pp. : 141-144

Oxford University Press

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Local lattice parameter determination of a silicon (001) layer grown on a sapphire (11¯02) substrate using convergent-beam electron diffraction

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Journal of Electron Microscopy, Vol. 55, Iss. 3, 2006-06 ,pp. : 129-135

Oxford University Press

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Formation of crystalline silicon in kaolinite by electron beam irradiation and in situ heating in the HVEM

By Lee Sujeong   Kim Young-Min   Kim Youn-Joong  

Journal of Electron Microscopy, Vol. 56, Iss. 4, 2007-08 ,pp. : 153-155

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Electron beam coherence measurements using diffracted beam interferometryholography

By Herring Rodney A.  

Journal of Electron Microscopy, Vol. 58, Iss. 3, 2009-06 ,pp. : 213-221

Oxford University Press

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