Heat- and electron-beam-induced transport of gold particles into silicon oxide and silicon studied by in situ high-resolution transmission electron microscopy

Author： Biskupek Johannes   Kaiser Ute   Falk Fritz  

Publisher： Oxford University Press

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.57, Iss.3, 2008-06, pp. : 83-89

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